Most of the 3-D measurement technique using pattern projection proposed until now may have to adjust the parameter of measurement system, and will become unable to be used, when measurement environmental conditions variant. In order to solve the above problem, a new 3-D image measurement method with active projection technique is proposed. The key point is that, according to the variant of the object and environmental conditions, the projection structure such as the form, the color and the space frequency distribution of projection pattern can be controlled automatically to obtain an ideal measurement image.
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