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A compact, low-cost, high-performance test fixture for electrical test and control of smart pixel integrated circuits

机译：一种紧凑，低成本，高性能测试夹具，用于电气测试和控制智能像素集成电路

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摘要

We have developed a low-cost, compact test fixture that can supply and monitor high-speed electrical signals for smart pixel ICs packaged in an 84-pin PGA chip carrier.

机译：我们开发了一种低成本，紧凑的测试夹具，可提供和监控智能像素IC的高速电信号，用于84引脚PGA芯片载体。

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《IEEE/LEOS Summer Topical Meeting》|1996年||共2页
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Kiamilev F.; Rozier R.; Institute of Electric and Electronic Engineer;
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中图分类自动化技术、计算机技术;
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1. A compact low-cost test equipment for thermal and electrical characterization of integrated circuits [J] . Alessandro Cabrini, Laura Gobbi, Davide Baderna, Measurement . 2009,第2期

机译：紧凑的低成本测试设备，用于集成电路的热和电特性
2. A GHz multi-channel cryogenic test fixture for superconducting integrated circuit testing [J] . Aoyagi M., Kikuchi K., Sato Y., IEEE Transactions on Applied Superconductivity . 2003,第2期

机译：用于超导集成电路测试的GHz多通道低温测试夹具
3. A GHz multi-channel cryogenic test fixture for superconducting integrated circuit testing [J] . Aoyagi M., Kikuchi K., Sato Y., IEEE Transactions on Applied Superconductivity . 2003,第2期

机译：用于超导集成电路测试的GHz多通道低温测试夹具
4. A compact, low-cost, high-performance test fixture for electrical test and control of smart pixel integrated circuits [C] . Kiamilev, F., Rozier, . 1996

机译：紧凑，低成本，高性能的测试夹具，用于智能像素集成电路的电气测试和控制
5. Efficient testing of high-performance data converters using low-cost test instrumentation. [D] . Goyal, Shalabh. 2007

机译：使用低成本测试仪器对高性能数据转换器进行高效测试。
6. Technical Note: Compact three-tesla magnetic resonance imager with high-performance gradients passes ACR image quality and acoustic noise tests [O] . Paul T. Weavers, Yunhong Shu, Shengzhen Tao, -1

机译：技术说明：具有高性能梯度的紧凑型三特斯拉磁共振成像仪通过了ACR图像质量和声学噪声测试
7. Computer controlled automatic test system for testing integrated circuits [O] . Walton Robin Leslie Arthur Electrical Engineering Faculty of Engineering UNSW 1972

机译：计算机控制的自动测试系统，用于测试集成电路
8. Universal test fixture for monolithic mm-wave integrated circuits calibrated with an augmented TRD algorithm [R] . Romanofsky, Robert R., Shalkhauser, Kurt A. 1989

机译：用增强TRD算法校准的单片毫米波集成电路的通用测试夹具

A compact, low-cost, high-performance test fixture for electrical test and control of smart pixel integrated circuits

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