首页> 外文会议>Workshop on MCM and VLSI Packaging Techniques and Manufacturing Technologies >'Package cracking and delamination susceptibility of thin small outline packages (TSOP)'
【24h】

'Package cracking and delamination susceptibility of thin small outline packages (TSOP)'

机译:“薄小纲包装(TSOP)的包装开裂和分层易感性”

获取原文

摘要

Mold compounds which are used for plastic encapsulated integrated circuits have the ability to absorbe and to store humidity originated from the ambient environment. During the soldering process for printed circuit board assembly, the stored humidity will be vapourized and can create an internal pressure. This pressure may cause cracks in the mold compound and / or delaminations at the interface between die, lead frame, die paddle and mold compound. The cracks and delaminations could lead to corrosion on the die Surface or broken bond wires due to mechanical forces during temperature change resulting in a reduced lifetime of the component.
机译:用于塑料封装的集成电路的模具化合物具有吸收和储存来自周围环境的湿度的能力。在印刷电路板组件的焊接过程中,储存湿度将受到抑制的并且可以产生内部压力。该压力可能在模具,引线框架,模桨和模具化合物之间的界面中导致模具化合物和/或分层中的裂缝。由于在温度变化期间的机械力导致组分的寿命减小,裂缝和分层可能导致模具表面或断裂粘接线上的腐蚀。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号