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Preparation of TiO_2 Thin Films by Sol-Gel Method and Analysis of its Transmittance Based on Computer Image Processing

机译:溶胶 - 凝胶法制备TiO_2薄膜的基于计算机图像处理的透射率分析

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TiO_2 films were prepared by sol-gel method with butyl titanate, anhydrous ethanol, acetyl acetone and hydrochloric acid as raw materials, which were sintered at 380 °C and 530 °C respectively to obtain TiO_2 films. XRD was used for analyzing the crystal structure of TiO_2 film, and ImageJ software was used to detect the light transmittance of TiO_2 film samples. The results show that the film sintered at 530 °C is brookite structure and the film sintered at 380 °C is anatase structure. The increase of sintering temperature is not conducive to the growth of TiO_2 film crystals. TiO_2 films sintered at 380 °C have good light transmittance.
机译:通过溶胶 - 凝胶法与钛酸丁酯,无水乙醇,乙酸乙酮和盐酸作为原料制备TiO_2薄膜,分别在380℃和530℃下烧结以获得TiO_2膜。 XRD用于分析TiO_2薄膜的晶体结构,并且使用ImageJ软件来检测TiO_2膜样品的透光率。结果表明,在530℃下烧结的膜是Brookite结构,并且在380℃下烧结膜是锐钛矿结构。烧结温度的增加不利于TiO_2膜晶体的生长。 TiO_2薄膜在380°C时烧结具有良好的透光率。

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