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Seeded Porous Silicon Preparation as a Substrate in the Growth of ZnO Nanostructures

机译:种子多孔硅制备作为ZnO纳米结构生长的基材

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In this work, seeded porous silicon (PSi) was used as a substrate in the growth of ZnO nanostructures. PSi was prepared by electrochemical etching method. ZnO thin films as seeded were deposited via sol-gel spin coating method. ZnO nanostructures were grown on seeded PSi using hydrothermal immersion method. In order to study the effect of post-heat treatment on the substrate, post annealing temperature were varied in the range of 300 to 700°C. The FESEM results shows ZnO thin film composed of nanoparticles were distributed over the PSi surface. Based on AFM characterization, the smoothest surface was produced at post annealing temperature of 500°C. There are two different peaks appeared in PL characterization. The peak in near-UV range is belonging to ZnO thin films while a broad peak in visible range can be attributed to ZnO defects and PSi surface. In addition, FESEM, XRD and PL were used to characterize the ZnO nanostructures. The FESEM results revealed ZnO nano-flower were successfully grown on seeded PSi. Hexagonal wurtzite of ZnO with dominated by the plane (100), (002), and (101) was found by XRD characterization. Two different peaks in UV range and visible range can be attributed to ZnO nano-flower and various defects of ZnO, respectively.
机译:在这项工作中,将种子多孔硅(PSI)用作ZnO纳米结构生长中的基材。通过电化学蚀刻方法制备PSI。通过溶胶 - 凝胶旋涂法沉积种子的ZnO薄膜。使用水热浸渍法在接种PSI上生长ZnO纳米结构。为了研究对基板上的热处理的影响,后退火温度在300至700℃的范围内变化。 FESEM结果显示由纳米颗粒组成的ZnO薄膜分布在PSI表面上。基于AFM表征,在500℃的后退火温度下产生最平滑的表面。 PL表征中出现了两种不同的峰值。近UV范围内的峰属于ZnO薄膜,而可见范围中的宽峰可以归因于ZnO缺陷和PSI表面。另外,FeSEM,XRD和PL用于表征ZnO纳米结构。 FESEM结果揭示了ZnO纳米花被成功种植在种子PSI上。通过XRD表征发现由平面(100),(002)和(101)主导的ZnO的六角形湿度ZnO。 UV范围和可见范围中的两个不同峰可以归因于Zno纳米花和ZnO的各种缺陷。

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