An Automated Digital Testing System for High-Resolution ADC Based on the Feedback Loop Method Using Low-Resolution DAC Signal

摘要

This paper presents an automated digital testing system for high-resolution ADC with low-resolution DAC signal. This system mainly comprises a low-resolution DAC (or signal source), a feedback loop circuit, a bias voltage device and a reference voltage source controlled by a digital potentiometer. By the digital potentiometer constantly fine-tuning the reference voltage and joining bias voltage timely, the output of DAC can completely measure all the codes of high-resolution ADC under test. This system solves the problem that low-resolution DAC signal tests high-resolution ADC inaccurately, which not only greatly reduce the test cost, but also can be applied to a variety of ADC hardware testing environments. The simulation results show that, 10-bit DAC signal in this system can measure each code of 14-bit ADC twice at least. The proposed testing system shows a new feasible solution to high-resolution ADC test.