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Electrical Testing of the OLED Matrix for Analyzing Defects in a PMOLED Display

机译:用于分析PMOLED显示屏中的缺陷的OLED矩阵的电气测试

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Organic Light Emitting Diode (OLED) based displays are viable alternative to Liquid Crystal Display (LCD) displays. However, OLED displays are still costlier due to the low yield of production which is due to the visual defects in the displays. A defect-free display is a prime requisite for a flat panel display application. Hence it becomes important to understand the possible defects and their root causes. Here, we have created defects intentionally in a small OLED matrix and studied the possible visual manifestations in a Passive Matrix Light Emitting Diode (PMOLED) display by electrically probing and visualizing waveforms on a Cathode-Ray Oscilloscope (CRO).
机译:有机发光二极管(OLED)的显示器是可行的液晶显示器(LCD)显示器的可行替代方案。然而,由于显示器的视觉缺陷导致的生产率低,OLED显示器仍然是肋骨。无缺陷显示是平板显示应用的主要必需品。因此,了解可能的缺陷和根本原因变得重要。这里,我们在小OLED矩阵中有意地创建了缺陷,并通过在阴极射线示波器(CRO)上电动探测和可视化波形来研究无源矩阵发光二极管(PMOLED)显示中的可能的视觉表现。

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