EXPERIMENTAL SET-UP FOR CHARACTERIZATION OF DEVICES FOR INTEGRATED PHOTONICS

摘要

The paper deals with design and realization of experimental set-up for characterization of device for integrated photonics. Computer controlled experimental setup including opto-mechanical positioning system with sub-microns precision is described in the first paper part. In the second part it is shown realized experimental set-up and discussed the two most important methods used for swept wavelength testing of devices for integrated photonics. In the last paper part it is reported spectral dependent insert losses measurement results of several type devices in the spectral range from 1520 to 1570nm with automatically calculated parameters of measured data. The temperature dependence of spectral dependent insert loss of individual array waveguide grating channel is reported.