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Electromechanical characterization of piezoceramic elements around resonance frequencies at high excitation levels and different thermodynamic conditions

机译:高励磁水平谐振频率附近压电母细胞元素的机电表征及不同热力学条件

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Electromechanical characterization of piezoceramic bulk elements around resonance is usually done with low-level continuous excitation signals at room temperature, but in real applications such elements are driven with different types of electrical signals, usually at higher levels and at different ambient temperatures. Both homemade and commercial soft and hard PZT piezoceramic elements were characterized using the established characterization methods that include the measurements of electrical admittance and surface displacement of the piezoceramic elements around the series resonance frequencies of two modes of vibration (radial and thickness extensional). The measurements included fast frequency sweeps at constant voltage excitation levels, burst measurements, at different temperatures and at different levels of excitation. A novel method for electromechanical characterization of piezoceramic elements that utilizes the resonance frequency tracking at different excitation levels (electric fields up to 5 kV/m, currents up to 1.3 A at resonance) and temperature conditions (up to 150 °C) has been proposed. The main idea is to keep the investigated element in resonance as the excitation level changes by constant tracking of its resonance frequency. The electromechanical parameters of the considered elements change mostly due to the nonlinear effects and the changes due to different thermodynamic conditions can be neglected when fast algorithm is applied. The decrease of the input electrical admittance magnitude is more expressed than the change of the resonance frequency when algorithm is applied.
机译:谐振周围的压电织式散装元件的机电表征通常在室温下具有低水平的连续激发信号,但在实际应用中,这种元件通过不同类型的电信号驱动,通常在更高的水平和不同的环境温度下。自制和商业软和硬质Putzoceramic元件的特征在于使用规定的表征方法,包括在两种振动模式的串联谐振频率周围的压电陶瓷元件的电气导纳和表面位移的测量(径向和厚度延伸)。测量值包括在恒定电压激发水平,突发测量,不同温度和不同水平的恒定电压激励水平下的快速频率扫描。利用不同激励水平利用谐振频率跟踪的压电晶体元件的机电表征的新方法(电场高达5kV / m,谐振高达1.3A的电流)和温度条件(高达150°C) 。主要思想是将研究的元素保持在共振中,因为激发水平通过恒定跟踪其共振频率而变化。所考虑的元件的机电参数主要是由于非线性效应而变化,并且在应用快速算法时可以忽略由于不同的热力学条件引起的变化。当应用算法时,输入电导入幅度的减小比谐振频率的变化更加表达。

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