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Magneto-optical properties of group-IV ferromagnetic semiconductor Ge_(1-x)Fe_x grown by low-temperature molecular beam epitaxy

机译:低温分子束外延生长的IV族铁磁半导体Ge_(1-x)Fe_x的磁光性能

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Group-IV ferromagnetic semiconductor Ge_(1-x)Fe_x was grown by low-temperature molecular beam epitaxy without precipitation of ferromagnetic Ge-Fe intermetallic compounds. The ferromagnetism of Ge_(1-x)Fe_x films was investigated by magnetic circular dichroism (MCD). In particular, the influence of the Fe content (X=2.0 PERCENT-17.5 PERCENT) and growth temperature (100 and 200 deg C) on the ferromagnetism was carefully studied. The MCD measurements revealed that the overall spectral features reflecting the band structure of the Ge_(1-x)Fe_x films were identical with those in bulk Ge, and that the large spin splitting of the band structure was induced by the incorporation of Fe atoms into the Ge matrix, indicating the existence of s,p-d exchange interactions. The Ge_(1-x)Fe_x films showed ferromagnetic behavior and the ferromagnetic transition temperature linearly increased with increasing the Fe concentration. These results indicate that the epitaxially grown Ge_(1-x)Fe_x is an intrinsic ferromagnetic semiconductor.
机译:通过低温分子束外延生长Group-IV铁磁半导体Ge_(1-x)Fe_x,而不沉淀铁磁性Ge-Fe金属间化合物。通过磁圆形二色性(MCD)研究了GE_(1-X)FE_X薄膜的铁磁性。特别地,仔细研究了Fe含量(X = 2.0%-17.5%)和生长温度(100和200℃)的生长温度(100和200℃)的影响。 MCD测量结果显示,反射GE_(1-x)Fe_x膜的带结构的整体光谱特征与散装Ge中的那些相同,并且通过将Fe原子掺入进入的带结构的大自旋分裂GE矩阵,表示S,PD交换交互的存在。所述Ge_(1-x)的Fe_x片示铁磁行为和铁磁性转变温度线性增加Fe浓度增加。这些结果表明外延生长的Ge_(1-x)Fe_x是内在铁磁半导体。

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