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Novel SRAM Bias Control Circuits for a Low Power L1 Data Cache

机译:用于低功耗L1数据缓存的新型SRAM偏置控制电路

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This paper proposes two novel bias control circuits to manage the power consumption of inactive cache cells in data retention mode. Both circuits have lower power consumption and area overheads when compared to previous proposals. The first proposed circuit (Dynamic Bias Control circuit or DB-Control circuit) dynamically tracks the reference current and sets the bias voltage of cells, while the second (Self-Adjust Bias Control circuit or SAB-Control circuit) has a self-adjust property to set the bias voltages and also alleviates the instability problems that appear due to noise injection. Although any SRAM array can benefit from these circuits, to show their usefulness, we frame our study on a recently proposed dual-versioning L1 data cache that has been designed for chip multi-processors that implement optimistic concurrency proposals, where leakage current has more effect on power dissipation and on circuit instability. Therefore, we add the proposed bias control circuits to a 32KB dual-versioning SRAM (dvSRAM) cache and simulate and optimize the entire cache with 45-nm CMOS technology at 2GHz processor frequency and 1V supply voltage The simulations demonstrate the effectiveness of our proposed circuits to reduce the energy consumption of dvSRAM L1 data cache by 35.8% on average compared to the typical dvSRAM cache. This is achieved with a modest area increase of 1.6% per sub-array and negligible delay overhead. We also show that instability problems are alleviated by using the SAB-Control circuit.
机译:本文提出了两种新的偏置控制电路,以管理数据保留模式不活动的高速缓存单元的功率消耗。相比之前的建议时,这两种电路具有更低的功耗和面积开销。第一提出的电路(动态偏置控制电路或DB-控制电路)动态地跟踪参考电流,并设置电池的偏置电压,而第二个(自调节偏置控制电路或SAB-控制电路)具有自调节特性以设置偏置电压,并且还减轻了出现由于噪声注入的不稳定性问题。虽然任何SRAM阵列可以从这些电路,有利于展示自己的用处,我们框架上已经被设计为单芯片多处理器实现乐观并发的建议,其中漏电流有更多的影响最近提出的双版本L1数据缓存我们的研究对功耗和电路不稳定性。因此,我们添加所提出的偏压控制电路到32KB双版本SRAM(dvSRAM)高速缓存和模拟和优化与45纳米CMOS技术在2GHz处理器的频率和1V的电源电压的整个高速缓存的仿真结果表明我们的建议的电路的有效性由35.8%降低dvSRAM L1数据高速缓冲存储器的能量消耗的平均比典型dvSRAM缓存。这是通过每个子阵列和忽略的延迟开销1.6%的温和面积的增加来实现的。我们还表明,不稳定的问题,通过使用SAB控制电路缓解。

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