Implementation of an input-output method of diagnosis of analog electronic circuits in embedded systems

摘要

In the paper an implementation of a new modified 2D bilinear method [1] of fault detection and localisation of analog electronic circuits, taking into consideration tolerances of elements in embedded systems based on microcontrollers is described. This approach consists of two stages. In the first stage a fault dictionary consisting of a nominal area representing a fault-free circuit and coefficients defining widths of localisation belts are created. In the second stage the measurement procedure and the algorithm of fault detection and localisation is made by the microcontroller mounted in an embedded system. A new procedure of measurements of a voltage and a time delay by the microcontroller, the new fault detection and localisation algorithm, the practical verification of the measurement procedure and the fault diagnosis procedure will be presented.