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Estimating a life expectancy of high-density recordable optical disks

机译:估计高密度可记录光盘的预期寿命

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We examine a lifetime estimation method for high-density recordable optical disks. It is based on the Eyring acceleration model and statistical analysis. The statistical distribution of life data for the optical disk assumed a lognormal distribution. The standardized life expectancy of an optical disk is defined as the minimum lifetime of 95% survival probability at 25°C/50%RH with a 95% confidence level. An acceleration test was conducted under stress conditions of temperature and relative humidity. Results have demonstrated that the statistical distribution of lifetime data using the digital error criterion item can be applied to a lognormal distribution. Thereby, we can estimate a standard life expectancy of high-density recordable optical disks as the minimum lifetime of 95% survival probability at a 95% confidence level.
机译:我们研究了一种用于高密度可记录光盘的寿命估计方法。它基于eATRING加速模型和统计分析。光盘的统计分布假设了Lognormal分布。光盘的标准化预期寿命定义为25℃/ 50%RH的最小寿命为95%的存活概率,95%置信水平。在温度和相对湿度的应力条件下进行加速试验。结果表明,使用数字误差标准项目的终身数据的统计分布可以应用于逻辑正种分布。因此,我们可以估计高密度可记录光盘的标准寿命,因为在95%的置信水平下的最小寿命为95%的存活率。

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