An On-Chip Transfer Function Characterization System for Analog Built-in Testing

摘要

A compact system for the on-chip transfer function characterization of an analog circuit is presented. It consists of a phase and amplitude detector and a signal generator. A general methodology for the use of this structure in the functional verification of a circuit under test (CUT) is provided. An integrated implementation of the proposed system in CMOS 0.35μm technology is described along with circuit-level design considerations. Experimental results of the application of this system in the characterization of a commercial programmable gain amplifier for frequencies up to 160MHz are also presented.