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Recent developments of the Scanning Positron Microscope SPM for depth- and position-resolved positron lifetime measurement

机译:扫描正电子显微镜SPM用于深度和位置分辨正电子寿命测量的最新进展

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To investigate inhomogeneous defect distributions, e.g. close to fatigue cracks or dispersive alloys with positron annihilation lifetime spectroscopy a pulsed positron beam with a diameter in the range of 1 μm and with a time resolution in the order of 250ps is needed. The Scanning Positron Microscope (SPM) fulfills the requirements for position resolved positron lifetime measurements and was operated by the Universitat der Bundeswehr München. To increase the countrate, the SPM is currently transferred to the intense positron source NEPOMUC. The SPM Interface connects the SPM to the NEPOMUC source and enhances the beam quality to the needs of the SPM. In this contribution we will give an overview of the SPM Interface and its performance. The finale stage of the SPM Interface is the positron elevator which has been further developed. We will discuss the apparatus in detail and show measurements of the beam quality with a beam elevation of 8 keV. From our measurements we are able to predict the performance of the SPM at NEPOMUC. In the future position resolved measurements will be possible with an improved spatial resolution of about 0.3 μm and an event rate of about 3.7 kHz.
机译:研究不均匀的缺陷分布,例如,接近具有正电子湮没寿命的疲劳裂缝或分散合金,脉冲正电子束,直径在1μm的范围内,需要花费250ps的时间分辨率。扫描正电子显微镜(SPM)满足了定位解决正电子寿命测量的要求,并由大学德国·塞尔姆镇运营。为了增加社会,目前SPM目前被转移到强烈的正电子源Nepomuc。 SPM接口将SPM连接到NEPOMUC源,并提高光束质量至SPM的需要。在这一贡献中,我们将概述SPM接口及其性能。 SPM界面的结肠阶段是已经进一步开发的正电子电梯。我们将详细讨论该装置,并显示光束质量的测量,带有8keV的光束升高。从我们的测量开始,我们能够预测SPM在Nepomuc的性能。在未来的位置解决的测量,将有所改善的空间分辨率约为0.3μm,事件率约为3.7kHz。

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