Phase Noise Metrology and Modelling of Microwave Transistors Applications to the design of state of the art Dielectric Resonator Oscillators

摘要

Phase noise in microwave transistors is studied both theoretically and experimentally using residual phase noise measurements. The experimental approach allows the exploration of many interesting features of phase noise generation in these devices, such as the dependence of phase noise versus microwave power or transistor low frequency loading, meanwhile nonlinear simulation is still necessary to optimise the microwave load and the whole oscillator circuit. The different behaviours described are illustrated in various microwave circuits, and particularly dielectric resonator oscillators, with some of them featuring state of the art performance.