S-Parameter Extraction of a Partially Filled Waveguide by Using the Finite Element Method and the Numerical TRL Calibration Technique

摘要

Inversion of the material parameters for a sample usually requires that the sample fill the waveguide cross-section. Alternative methods require that a non-filling sample be aligned along the center-line of the waveguide. However, it is not known how errors in placement impact the accuracy of the inversion. Hence, a numerical simulation to assess these errors is beneficial to the community. The extraction of the S-parameters from a rectangular-dielectric-filled waveguide is conducted numerically by means of the Finite Element Method (FEM) and the Thru-Reflect-Line (TRL) calibration technique. Three different ratios of dielectric sample width (d) to waveguide width (a) are primarily studied. The results are then validated with experimental data on the X-band. An assessment of error with respect to position will be presented at the meeting.