首页> 外文会议>IEEE International Symposium on Applications of Ferroelectrics >Microstructure study of Bi{sub}4Ti{sub}3O{sub}12- SrBi{sub}4Ti{sub}4O{sub}15 and Bi{sub}3.25La{sub}0.75Ti{sub}3O{sub}12- SrBi{sub}4Ti{sub}4O{sub}15 ceramics
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Microstructure study of Bi{sub}4Ti{sub}3O{sub}12- SrBi{sub}4Ti{sub}4O{sub}15 and Bi{sub}3.25La{sub}0.75Ti{sub}3O{sub}12- SrBi{sub}4Ti{sub}4O{sub}15 ceramics

机译:Bi {sub} 4Ti {sub} 3o {sub} 12-srbi {sub} 4ti {sub} 4o {sub} 15和bi {sub} 3.25la {sub} 0.75ti {sub} 3o {sub} 3 - srbi {sub} 4ti {sub} 4o {sub} 15陶瓷

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摘要

TEM study is preformed on mixed-layer type Bismuth compounds: Bi{sub}4Ti{sub}3O{sub}12-SrBi{sub}4Ti{sub}4O{sub}15 (BT-SBTi) and Bi{sub}3.25La{sub}0.75Ti{sub}3O{sub}12-SrBi{sub}4Ti{sub}4O{sub}15 (BLT-SBTi) ceramics. Meeting the prediction of space group theory, APBs and 90° domain wail are observed by bright- and dark-field imaging in both materials, Besides, other planer defects are found and confirmed to be stacking faults.
机译:TEM研究在混合层型铋化合物上进行了预先形成:Bi {Sub} 4Ti {Sub} 3o {sub} 12-srbi {sub} 4ti {sub} 4o {sub} 15(bt-sbti)和bi {sub} 3.25 LA {子} 0.75TI {SUB} 3O {SUB} 12-SRBI {SUB} 4TI {SUB} 4O {SUB} 15(BLT-SBTI)陶瓷。通过两种材料中的明亮和暗场成像观察到空间组理论,APB和90°域的预测,此外,还发现了其他刨型缺陷并确认堆叠故障。

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