首页> 外文会议>IEEE Conference on Nanotechnology >Coupling Length of Metal/Si Surface Plasmons in a Metal/Insulator/Si Structure Perforated with Periodic Square Hole Arrays
【24h】

Coupling Length of Metal/Si Surface Plasmons in a Metal/Insulator/Si Structure Perforated with Periodic Square Hole Arrays

机译:金属/绝缘子/ Si结构中金属/ Si表面等离子体的耦合长度与周期方孔阵列穿孔

获取原文
获取外文期刊封面目录资料

摘要

The zero-order transmission of radiation through a metal/dielectric structure perforated with square hole arrays is strongly enhanced when incident light resonates with surface plasmons (SPs). Surprisingly, when a metal/dielectric double layer, such as Ag/SiO_2, is fabricated on a silicon substrate, the Ag/Si SP mode by coupling Ag and Si across the intermediate dielectric film has been found. The transmission intensity is investigated as a function of the intermediate SiO_2 thickness. The coupling lengths between Ag and Si in order to form the Ag/Si SP mode are determined as well.
机译:当入射光与表面等离子体(SPS)共振时,强大地增强了通过用方形孔阵列穿孔的金属/介电结构的零级传输。令人惊讶的是,当在硅衬底上制造金属/介质双层,例如Ag / SiO_2,通过耦合Ag和跨越中间电介质膜的AG / Si SP模式。作为中间SiO_2厚度的函数研究了传输强度。也确定AG和SI之间的耦合长度以形成AG / SI SP模式。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号