We present a new method to improve the brightness of tapered fiber probes for near-field scanning optical microscope. The new probes are fabricated by adding high refractive index materials onto the pulled tapered fiber tips before coated with metal. With a tip size of 100 nm, the far-field optical power of the new tapered probe which has 25 nm thickness of zinc sulfide on tip end is about 5 times larger than the same sized traditional fiber probe.
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