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Laser processing for electronic circuit restructuring

机译:用于电子电路重构的激光加工

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The Center for Microelectronics Research (CMR) at the University of South Florida has pursued the development of high density interconnect technologies for advanced electronic systems. Primary focus has been in the area of Laser created interconnects for quick-turn around prototyping of electronic circuits fabricated using standard Very Large Scale Integration (VLSI) process techniques. The Laser Restructuring of a specific application circuitry at the wafer or packaged chip level is accomplished by creating low electrical resistance links between conductors and cutting conductor lines using an integrated computer controlled Laser system. Laser restructuring of generic electronic circuits, is an excellent technique for low-cost, quick turn around custom programmed circuits. A great effort was put into developing an infrastructure within the Laboratory that will conduct state of the art research while keeping manufacturing capabilities for rapid turn around of restructured circuitry using optimized process parameters. Total system control, flexibility, high data quality, and full documentation are examples of this R&D developed environment. Using Design of Experiment techniques and statistical data analysis, Laser created interconnects were studied. Optimum process parameters were obtained using this methodology. The complete process development will be presented at the conference including among others the design and software development of a stand alone interconnect controller (ICON), testing procedure for packaged, and the statistical data analysis for generating the optimum process parameter.
机译:南佛罗里达大学的微电子研究中心(CMR)追求了高密度互连技术的高密度互连技术。主要焦点已经在激光面积中,为使用标准非常大规模集成(VLSI)工艺技术制造的电子电路的原型设计的快速转动的互连。通过使用集成计算机控制的激光系统在导体和切割导体线之间产生低电阻链路来实现特定应用电路的激光重构。通用电子电路的激光重组,是一种低成本的优异技术,快速转向定制编程电路。在实验室内开发一个基础设施的巨大努力,该基础设施将在使用优化的工艺参数的情况下保持制造能力,同时保持制造能力,以便使用优化的工艺参数来快速转动重构电路。整体系统控制,灵活性,高数据质量和完整文档是该研发开发环境的示例。使用实验技术设计和统计数据分析,研究了激光创建的互连。使用该方法获得最佳过程参数。完成的完整流程开发将在会议上展示,包括独立互连控制器(图标)的设计和软件开发,包装的测试程序以及用于生成最佳过程参数的统计数据分析。

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