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Propagation mechanism and metallurgical characterization of first bond brittle heel cracks in AlSi wire

机译:Alsi丝第一键脆脚跟裂缝的繁殖机理及冶金表征

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Bottom die heel cracks in 1.25-mil Al-1% Si wires were found to cause opens and shorts. All the failures were attributed to brittle looking fatigue die heel breaks. This failure mechanism was traced and reproduced through experimentation and found to be directly caused by the 60-kHz ultrasonic energy vibrating the wire behind the tool during the first bond. Bonds with these cracks exhibit low pull strengths (1.0 g for annealed wires and 2.0 g on unannealed wires). In order to increase the frequency of these brittle cracks, hard AlSi wire was deliberately produced for this study. The frequency of the bottom cracks increased from one in a thousand to eight out of ten wires when normal wire (19 g tensile breaking force) was replaced with hard wire (35 g tensile breaking force). The wire bonding sequence was partitioned to determine the onset of the crack and its propagation. The magnitude of the cracking is described at five points in the bonding cycle. Results show that the ultrasonic vibration during first bond produces an incipient crack that further propagates during the remainder of the wire bond cycle. Full metallographic characterization of the wire, which included optical as well as scanning electron microscopy, was performed in order to investigate the matrix/particle involvement in the failed specimens.
机译:发现底部管腔裂纹1.25-mil Al-1%Si线的裂缝导致打开和短路。所有的失败都归因于脆弱的疲劳死亡脚跟休息。通过实验进行跟踪和再现这种故障机制,发现由60-kHz超声波能量振动在第一键期间振动工具后面的电线。具有这些裂缝的粘合表现出低拉强强度(用于退火线的1.0g,未解除导线> 2.0g)。为了增加这些脆性裂缝的频率,刻意为本研究制作硬铝线。当用硬线(35g拉伸力)替换常规线(19g拉伸断裂力)时,底部裂缝的频率从十架线中的一千倍增加。将线键合序列分配以确定裂缝的开始及其繁殖。裂缝的幅度在粘合循环中的五个点处描述。结果表明,第一键期间的超声波振动产生初始裂缝,其在线键合循环的其余部分进一步传播。进行包括光学以及扫描电子显微镜的线的完整金相表征,以研究失败的标本中的基质/颗粒受累。

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