首页> 外文会议>Electrical Insulation and Dielectric Phenomena, 1994. IEEE 1994 Annual Report., Conference on >Space charge characterization by the pressure pulse method inion-irradiated polyimide films
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Space charge characterization by the pressure pulse method inion-irradiated polyimide films

机译:用压力脉冲法表征空间电荷。离子辐照聚酰亚胺薄膜

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摘要

The Pressure Pulse Method allows in situ measurements of chargebuild-up and evolution in heavy ion irradiated Kapton samples with agood signal to noise ratio. Space charge is detected in films with athickness to range ratio larger or lower than one; in the latter case,ions are crossing throughout the material but a residual charge can bedetected. The mean projected range in a thick sample,p
机译:压力脉冲法可对电荷进行原位测量 重离子辐照的Kapton样品中的聚积和演化 良好的信噪比。在带有 厚度与范围之比大于或小于1;在后一种情况下, 离子贯穿整个材料,但残留电荷可以是 检测到。厚样本的平均投影范围, p >,以低通量准确确定

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