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TURBULENT STRUCTURE STUDY ON FLOW-INDUCED VIBRATION IN TEE JUNCTION PIPE

机译:三通管流动引起的湍流湍流结构研究

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Flow-Induced Vibration (FIV) caused by turbulent flow inside a pipe could lead to fatigue failure with shell mode vibration. Our previous study investigated the excitation source of the FIV for tee junctions experimentally to understand the FIV mechanism and provided Power Spectral Density (PSD) profiles of pressure fluctuation. In the present study, experiments were performed with more extensive measurement points for both 90- and 45-degree tees to understand a more detailed mechanism. PSD plots were provided, featuring different pressure fluctuation characteristics at each measurement point among both angle tees. It also emerged that the PSD level declined with increasing distance from the impingement point. Unsteady Computational Fluid Dynamics (CFD) simulations with the Large Eddy Simulation (LES) model were also performed to understand the turbulent structure for the tee junctions. The frequency characteristic of the simulated pressure fluctuation effectively matched those of the experiments at each measurement point, which implies that CFD simulation with an LES model could reveal reasonable predictions of the FIV excitation source for tee junctions. Simulation results showed that the relatively large vortex shed from the branch pipe impinged periodically on the main pipe bottom and the large vortex was dissipated downstream. These vortex behaviors would be the main mechanism generating the FIV excitation source.
机译:由管道内部的湍流引起的流致振动(FIV)可能导致壳模振动导致疲劳破坏。我们先前的研究通过实验研究了三通接头的FIV激发源,以了解FIV机理,并提供了压力波动的功率谱密度(PSD)曲线。在本研究中,对90度和45度三通进行了更广泛的测量点实验,以了解更详细的机理。提供了PSD图,在两个T形三通之间的每个测量点都具有不同的压力波动特性。还发现,PSD水平随着距撞击点距离的增加而下降。还使用大涡模拟(LES)模型进行了非稳态计算流体动力学(CFD)模拟,以了解三通接头的湍流结构。模拟压力波动的频率特性在每个测量点都与实验的频率特性有效匹配,这表明使用LES模型的CFD模拟可以揭示三通接头FIV激励源的合理预测。仿真结果表明,支管产生的较大涡旋周期性地撞击在主管底部,并且大涡旋向下游消散。这些涡旋行为将是产生FIV激发源的主要机制。

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