首页> 外文会议>Conference on Physics of Medical Imaging >Estimating basis line-integrals in spectral distortion-modeled photon counting CT: K-edge imaging using dictionary learning-based x-ray transmittance modeling
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Estimating basis line-integrals in spectral distortion-modeled photon counting CT: K-edge imaging using dictionary learning-based x-ray transmittance modeling

机译:估计基于光谱失真模型的光子计数CT中的基线积分:使用基于字典学习的X射线透射率建模的K边缘成像

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Photon counting detector (PCD) provides spectral information for estimating basis line-integrals; however, the recorded spectrum is distorted from spectral response effect (SRE). One of the conventional approaches to compensate for the SRE is to incorporate the SRE model in the forward imaging process. For this purpose, we recently developed a three-step algorithm as a (~xl, 500) fast alternative to maximum likelihood (ML) estimator based on the modeling of x-ray transmittance, exp (- f μ_a(r, E)dr), with low-order polynomials. However, it is limited on the case when K-edge is absent due to the smoothness property of the low-order polynomials. In this paper, we propose a dictionary learning-based x-ray transmittance modeling to address this limitation. More specifically, we design a dictionary which consists of several energy-dependent bases to model an unknown x-ray transmittance by training the dictionary based on various known x-ray transmittance as a training data. We show that the number of bases in the dictionary can be as large as the number of energy bins and that the modeling error is relatively small considering a practical number of energy bins. Once the dictionary is trained, the three-step algorithm can be derived as follows: estimating the unknown coefficients of the dictionary, estimating basis line-integrals, and then correcting for a bias. We validate the proposed method with various simulation studies for K-edge imaging with gadolinium contrast agent, and show that both bias and computational time are substantially reduced compared to those of the ML estimator.
机译:光子计数检测器(PCD)提供光谱信息以估计基准线积分;但是,记录的光谱会因光谱响应效应(SRE)而失真。补偿SRE的常规方法之一是将SRE模型并入正向成像过程中。为此,我们最近基于x射线透射率exp(-fμ_a(r,E)dr ),低阶多项式。然而,由于低阶多项式的平滑性,这在缺少K-edge的情况下受到限制。在本文中,我们提出了一种基于字典学习的X射线透射率建模来解决此限制。更具体地说,我们设计了一个字典,该字典由多个依赖于能量的碱基组成,通过基于各种已知x射线透射率作为训练数据来训练字典,从而对未知的x射线透射率进行建模。我们表明,字典中的碱基数可以与能量仓的数量一样多,并且考虑到能量仓的实际数量,建模误差相对较小。训练完字典后,可以按以下步骤得出三步算法:估算字典的未知系数,估算基准线积分,然后校正偏差。我们使用various对比剂对K边缘成像进行了各种模拟研究,验证了所提出的方法,并表明与ML估计器相比,偏差和计算时间都大大减少了。

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