Evaluation of high performance converters under low dose rate total ionizing dose (TID) testing for NASA programs

摘要

This paper reports the results of low dose rate (0.02-0.04 Rads(Si)/sec) TID tests performed on several types of high performance analog-to-digital and digital-to-analog converters (ADCs/DACs). The test results showed that BiCMOS parts were very susceptible to radiation damage at very low levels [2-5 kRads(Si)] and the bipolar parts showed higher tolerance [20-100 kRads(Si)] depending on the part type and manufacturer.