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SiC JFET integrated circuits for sensing and control at temperatures up to 600°C

机译:SiC JFET集成电路,可在高达600°C的温度下进行感应和控制

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N-channel JFET integrated circuits were fabricated in 6H silicon carbide, a wide-bandgap semiconductor capable of operation at extremely high temperatures, to support applications in high-temperature sensing and control commonly found in systems that consume or generate large quantities of energy. The JFETs were successfully modeled, and hybrid amplifiers were constructed using SiC differential pairs and silicon active/passive components to provide a high-temperature sensor interface circuit requiring minimal SiC integration. Fully integrated, differential amplifiers were designed, fabricated, and tested. A two-stage amplifier with current-source loads and common-mode feedback in the 1st-stage, has a voltage gain of 69 dB at 576°C, with just 3.6 dB gain-variation from 25 to 576°C. High-performance, integrated logic circuits were also developed. The inverter has excellent dc characteristics with a gain > −20 up to 500°C. NAND/NOR logic circuits were tested dynamically and perform well at temperatures up to 550°C.
机译:N沟道JFET集成电路由6H碳化硅制成,碳化硅是一种能在极高温度下工作的宽带隙半导体,可支持在消耗或产生大量能量的系统中常见的高温传感和控制应用。对JFET进行了成功建模,并使用SiC差分对和硅有源/无源元件构建了混合放大器,以提供需要最少SiC集成度的高温传感器接口电路。完全集成的差分放大器经过设计,制造和测试。具有第一级电流源负载和共模反馈的两级放大器在576°C时具有69 dB的电压增益,在25至576°C范围内仅有3.6 dB的增益变化。还开发了高性能,集成逻辑电路。逆变器具有出色的直流特性,在500°C时增益> −20。 NAND / NOR逻辑电路经过动态测试,在高达550°C的温度下性能良好。

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