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Persistence and charge diffusion in an E2V CCD42-90 deep-depletion CCD

机译:E2V CCD42-90深耗尽CCD中的余辉和电荷扩散

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The ESPaDOnS spectrograph at the Canada-France-Hawaii Telescope was recently upgraded to use an E2V CCD42-90deep-depletion CCD. While changing to this device from a standard silicon CCD42-90 had many benefits such as muchhigher red QE and much lower fringing, it was also found that the new device exhibited persistence. After talking withE2V, a solution to the persistence was found, but this resulted in reduced resolution on the spectrograph from chargediffusion. This paper will describe the solution found to allow the detector to run with no persistence and with limitedcharge diffusion.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
机译:加拿大-法国-夏威夷望远镜的ESPaDOnS光谱仪最近进行了升级,以使用E2V CCD42-90深耗尽CCD。从标准硅CCD42-90转换到该设备具有许多好处,例如更高的红色QE和更低的边缘,但还发现新设备显示出持久性。与E2V交谈后,找到了解决持久性的方法,但是这导致了带电扩散导致光谱仪的分辨率降低。本文将介绍发现的解决方案,该解决方案可以使检测器在没有余辉的情况下运行,并且电荷扩散不受限制。©(2012)版权所有,美国光电仪器工程师协会(SPIE)。摘要的下载仅允许个人使用。

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