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Thermal Performance Analysis for Packaging Configuration Design of Multifinger GaInP Collector-Up HBTs as Small High-Power Amplifiers

机译:小型高功率放大器的多指GaInP集电极HBT封装配置设计的热性能分析

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摘要

A finite-element modeling (FEM) methodology is utilized to investigate the thermal performance of GaInP collector-up heterojunction bipolar transistors (C-up HBTs) with thermalvia packaging configurations. The thermal interaction between HBT fingers has been examined based on the temperature distribution phenomena in multifinger C-up HBTs. The results obtained from the C-up HBT with a threefinger structure indicate that the thickness of thermal-via configuration can be further reduced by 33% without deteriorating the thermal performance. From this analysis, it is demonstrated that thinning the thermal-via packaging design should be an effective approach for miniaturization of C-up HBTs as high-power amplifiers in cellular-phone communication systems.
机译:利用有限元建模(FEM)方法来研究具有热通孔封装配置的GaInP集电极向上异质结双极晶体管(C向上HBT)的热性能。已基于多指C-up HBT中的温度分布现象检查了HBT指之间的热相互作用。从具有三指结构的C-up HBT获得的结果表明,可以将通孔结构的厚度进一步减小33%,而不会降低热性能。从该分析中可以看出,减薄热通孔封装设计应该是使C-up HBT小型化的有效方法,从而使其成为蜂窝电话通信系统中的高功率放大器。

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