首页> 外文会议>Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International >Process qualification strategy for advanced embedded non-volatile memory technology - the Philips 0.18 /spl mu/m embedded flash case
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Process qualification strategy for advanced embedded non-volatile memory technology - the Philips 0.18 /spl mu/m embedded flash case

机译:高级嵌入式非易失性存储器技术的工艺鉴定策略-Philips 0.18 / spl mu / m嵌入式闪存盒

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摘要

A qualification strategy for advanced embedded non-volatile memory technology has been revealed. This strategy consists of: a thorough understanding of the requirements, extensive use and frequent update of the FMEA (failure mode effect analysis), a qualification plan with excellent coverage of all the risk areas, implementing effective in-line and off-line measures and control, and check-off of all the tests with good results. With such a strategy in place, the Philips 0.18 /spl mu/m embedded flash technology has been successfully qualified for volume production.
机译:已经揭示了先进的嵌入式非易失性记忆技术的资格策略。该策略包括:彻底了解FMEA的要求,广泛使用和频繁更新(故障模式效果分析),资格计划,具有卓越的所有风险领域,实施有效的在线和离线措施控制,并以良好的结果检查所有测试。利用这种策略到位,飞利浦0.18 / SPL MU / M嵌入式闪存技术已成功获得批量生产。

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