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Characterization of the van Cittert monochromator based IR spectrophotometer

机译:基于van Cittert单色仪的IR分光光度计的表征

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The van Cittert system consists of two identical monochromators coupled together as a subtractive system. The usual narrow slit between the two monochromators is replaced by a wide one and a part of this wide slit is covered by a lamella mounted on a fine resolution translating stage. The wide slit transmits a wide spectral range but the lamella filters out a narrow range like a notch filter. The second monochromater collects and recombines the transmitted radiation at its exit slit. Behind the exit slit and the beam forming elements can the sample be positioned. By the translation fo the lamella the center wavelength of the notch can be shifted over the whole spectral range covered by the wide slit. Carrying out spectrophotometric measurements the total transmitted power is measured at every stop of the lamella. From this array of measurement results the transmittance or the reflectance of the sample can be calculated as a function of the wavelength.
机译:van Cittert系统由两个相同的单色器组成,作为减法系统耦合在一起。两种单色器之间的通常的窄切口被宽的一个宽的狭缝所取代,并且由安装在精细分辨率平移阶段的薄片覆盖。宽狭缝传输宽的光谱范围,但薄片滤除距离凹口过滤器的窄范围。第二单色摩擦收集并重新结合其出口狭缝的透射辐射。出口狭缝后面和梁形成元件可以定位样品。通过翻译薄片,凹口的中心波长可以在宽狭缝覆盖的整个光谱范围内移位。进行分光光度测量测量总透射功率在薄片的每个停止时测量。从该测量阵列结果,可以根据波长的函数计算样品的透射率或反射率。

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