REBIC studies of grain boundaries in II-VI compounds

摘要

Remote electron beam induced current (REBIC) was used to study electrically active grain boundaries (GBs) in ZnS, ZnSe and ZnS,Se. Examples of peak-and-trough (PAt) contrast due to trapped-charge induced energy band bending and terraced contrast the to high resistivity GB layers were found. GB dark contrast interpretable by the Donolato phenomenological theory as well as bright contrast due to reduced recombination were also seen. Reducing the temperature had no major effect on the REBIC contrast.