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Size and Shape Effect in the Determination of the Fracture Strength of Silicon Nitride in MEMS Structures at High Temperatures

机译:确定高温下MEMS结构中氮化硅断裂强度的尺寸和形状效应

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Several applications require Micro electro mechanical systems MEMS devices to operate under high temperatures. Previous efforts to study the properties of MEMS materials have shown that an increase in temperature leads to a decrease in the fracture strength. In this paper, three different thin film silicon nitride dog-bone shaped structures suspended on a silicon substrate are used to determine their fracture strength as a function of temperature using tensile strength testing. Analytical modeling is used to determine the elastic resistance of the thin film dog-bones to stresses caused by the forces originated by the difference in coefficient of thermal expansion between the dog-bones and their substrate. The calculated forces incorporate the effect of temperature in these interactions and the mechanical properties of the two materials by considering the temperature dependence of elastic modulus and coefficient of thermal expansion. Analytical results show that the fracture strength of a 175nm silicon nitride thin film decreases from 289MPa to 146MPa as temperatures increase from 250 to 500 degrees Celsius. When compared to other studies, these values show a consistent trend, thus also presenting this as a simple and promising in-situ method for the determination of fracture strength of MEMS devices operating at high temperatures.
机译:一些应用要求微机电系统MEMS器件在高温下运行。先前研究MEMS材料性能的努力表明,温度升高会导致断裂强度降低。在本文中,使用三种不同的悬浮在硅基板上的薄膜氮化硅狗骨头形结构,通过拉伸强度测试确定其断裂强度随温度的变化。使用分析建模来确定薄膜狗骨对应力的弹性抵抗力,该应力是由狗骨与其基板之间的热膨胀系数差异所产生的力所引起的。通过考虑弹性模量和热膨胀系数对温度的依赖性,计算得出的力将温度的影响纳入了这些相互作用以及两种材料的机械性能。分析结果表明,随着温度从250摄氏度升高到500摄氏度,175nm氮化硅薄膜的断裂强度从289MPa降低到146MPa。当与其他研究比较时,这些值显示出一致的趋势,因此也将其表示为一种简单且有希望的就地方法,用于确定在高温下运行的MEMS器件的断裂强度。

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