首页> 外文会议>International Conference on Electronic Packaging Technology >Effect of the Au bonding pad contamination on the wettability of Au/Sn-3.0Ag-0.5Cu/Au solder joints in flux-free laser jet solder ball bonding process
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Effect of the Au bonding pad contamination on the wettability of Au/Sn-3.0Ag-0.5Cu/Au solder joints in flux-free laser jet solder ball bonding process

机译:无助焊剂激光喷射球焊工艺中金焊盘污染对金/锡-3.0Ag-0.5Cu / Au焊点润湿性的影响

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With the advantages of non-contact, flexible, high energy density and local heating, the laser jet solder ball bonding (SBB) technique is widely used in electronic packaging. The reliability of laser jet SBB solder joints has long been concerned. As is well known, the wettability (i.e., the spreading ability) of the molten solder on the boding pad is a key factor influencing the formation and performance of solder joints. Previous studies have revealed that the oxidation of the solder balls can lead to the poor wetting during the laser jet SBB process. Meanwhile, the surface contamination of the bonding pads is inevitable in mass production, which may be another essential factor causing the soldering quality problem for the flux-free laser jet SBB process and the mechanism is still unclear so far. In this study, the factors leading to the poor wetting of 90 μm diameter Sn-3.0Ag-0.5Cu solder balls on Au bonding pads have been ascertained, in particular the surface contamination of Au bonding pads is investigated by using a surface analytical technique called Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS). When the possibility of the oxidation layer of solder balls is excluded, the poor wetting of Au/Sn-3.0Ag-0.5Cu/Au solder joints is caused dominantly by the surface contamination of Au bonding pads. So, the surface elements of the poorly wetted bonding pads and the normal ones were comparatively investigated by employing TOF-SIMS with the intensity of the contamination. The results manifest obviously that the surface contamination of Au bonding pads is closely correlated with the poor wettability. The intensity of Au peak on the normal pad is higher, while being lower on the poorly wetted pads. In addition, the characteristic peaks of few organics are also found, indicating that the Au bonding pads are contaminated and evenly covered by some organic and inorganic contaminants, which directly lead to the poor wettability of solder joints during flux-free laser jet SBB process. Further, the mechanism of the poorly wetted solder joints induced by the contamination is analyzed and the near quantitative results are also discussed.
机译:由于具有非接触,柔性,高能量密度和局部加热的优点,激光喷射焊球接合(SBB)技术被广泛用于电子包装中。长期以来,一直关注激光喷射SBB焊点的可靠性。众所周知,熔融焊料在结合垫上的润湿性(即散布能力)是影响焊点形成和性能的关键因素。先前的研究表明,焊锡球的氧化会导致在激光喷射SBB工艺过程中润湿性差。同时,在批量生产中不可避免地会发生焊盘的表面污染,这可能是导致无助焊剂激光喷射SBB工艺出现焊接质量问题的另一个重要因素,其机理至今仍不清楚。在这项研究中,已经确定了导致Au焊盘上直径为90μm的Sn-3.0Ag-0.5Cu焊料球润湿性较差的因素,尤其是通过使用一种称为的表面分析技术研究了Au焊盘的表面污染。飞行时间二次离子质谱(TOF-SIMS)。当排除焊球氧化层的可能性时,Au / Sn-3.0Ag-0.5Cu / Au焊点的不良润湿主要是由于Au焊盘的表面污染引起的。因此,采用TOF-SIMS对污染较弱的焊盘和普通焊盘的表面元素进行了比较研究。结果显然表明,金键合焊盘的表面污染与差的润湿性密切相关。正常垫片上的Au峰强度较高,而润湿较差的垫片上的Au峰强度较低。此外,还发现了少量有机物的特征峰,表明金键合焊盘被一些有机和无机污染物污染并均匀覆盖,这直接导致在无助焊剂激光喷射SBB过程中焊点的润湿性较差。此外,分析了由污染引起的润湿不良的焊点的机理,并讨论了近乎定量的结果。

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