Circuit Debug using Time Resolved Emission (TRE) Prober - A Case Study

摘要

Time Resolved Emission Microscopy (TRE) is a revolutionary tool used in advanced microprocessors silicon debug. Unlike other debug tools, the interpretation of TRE data may not be straightforward and can sometimes be misleading. In this paper we show through a case study why this is true. Interpretation of TRE data should be done carefully with good knowledge on device emission physics, circuit behavior and creative fault analysis.