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Design for reliability: A duty-cycle management system for timing violations

机译:可靠性设计:时间违规的占空比管理系统

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With continuous scaling of CMOS technology, a key issue for the microprocessor and application processor industries is the reliability of silicon. Two salient problems with silicon are Bias Temperature Instability (BTI), which increases the threshold voltage of MOSFETs, and Gate Oxide Breakdown (GOBD), which decreases the gate leakage resistance. Both pose severe limitations for sub-micrometer transistors. Threshold voltage and gate leakage current degradation affect setup/hold time violations and reduce system lifetime. To achieve a reliability tolerant system, we have developed a self-adaptive clock duty cycle controller (DCC) to avoid timing violations of critical paths of a microprocessor. Using lifetime prediction, we show how much the controller can extend system lifetime.
机译:通过CMOS技术的连续缩放,微处理器和应用处理器行业的关键问题是硅的可靠性。硅的两个突出问题是偏置温度不稳定性(BTI),其增加MOSFET的阈值电压,以及降低栅极泄漏电阻的栅极氧化物击穿(GOBD)。对亚微米晶体管构成严重限制。阈值电压和栅极泄漏电流劣化会影响设置/保持时间违规,减少系统寿命。为了实现可靠性耐受系统,我们开发了一种自适应时钟占空比控制器(DCC),以避免定时违反微处理器的关键路径。使用寿命预测,我们展示了控制器可以延长系统寿命。

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