Using Arduino and on-chip serial-to-parallel register to test widely-programmable ADCs

摘要

This paper presents an experimental set-up that combines on-chip digital techniques with off-chip Arduino-based hardware to simplify the test of widely-programmable analog-to-digital converters. The presented methodology is specially intended for analog and mixed-signal circuits which require a large number of digital signals to reconfigure their performance to different electrical specifications, environment signal conditions, battery status, etc. To this end, a serial-to-parallel register is implemented on chip in order to generate the required number of digital control signals from an input serial data provided offchip. Such serial data can be generated by using an Arduino-based hardware set-up, which can be easily programmed in MATLAB, with no additional test instruments required. As an application, the proposed method is applied to the experimental characterization of a fourth-order band-pass continuous-time ΣΔ modulator, integrated in a 65-nm CMOS technology, which can digitize signals placed at programmable carrier frequencies for software defined radio1.