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Accelerated life test method for storage vacuum electron device based on pressurization

机译:基于加压的存放真空电子器件加速寿命试验方法

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This paper proposes an accelerated life testing method for the storage vacuum electron device (VED) based on pressurization and establishes an accelerated life model. The accelerated life test of a VED is performed at 4.5 atm. The result showed that after pressurization the cathode current dropped faster than that when the VED was stored in air. The pressurization could accelerate the VED storage life.
机译:本文提出了一种基于加压的储物真空电子器件(VEE)的加速寿命试验方法,建立了加速的寿命模型。 VED的加速寿命试验在4.5atm下进行。结果表明,在加压后,阴极电流比VED储存在空气中时,阴极电流降低。加压可以加速VED储存寿命。

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