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A New Lock-Detect Circuit for Self Correcting DLLs

机译:用于自我校正DLL的新锁定检测电路

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This paper describes a new architecture for lock-detect circuit that is used in self correcting DLLs. Using this architecture solves the false locking problem of conventional DLLs. The operation of proposed architecture does not depend on the duty cycle of the input phases. The proposed lock-detect circuit is used in a wide frequency range and low jitter delay-locked loop. The circuit design and ADS simulation are based upon TSMC 0.18μm CMOS process. The simulation results show that the proposed DLL has a wide locking range from 120 to 420 MHz. Moreover rms jitter is as low as 1.2 ps at 420 MHz.
机译:本文介绍了用于自校正DLL的锁定检测电路的新架构。使用此架构解决了传统DLL的错误锁定问题。所提出的架构的操作不依赖于输入阶段的占空比。所提出的锁定检测电路用于宽频范围和低抖动延时锁环。电路设计和ADS仿真基于TSMC0.18μm的CMOS工艺。仿真结果表明,所提出的DLL宽锁定范围为120至420 MHz。此外,RMS抖动在420 MHz处低至1.2 ps。

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