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Electron-phonon and electron-defect scattering rates in semiconducting zigzag carbon nanotubes

机译:半导体之字形碳纳米管中的声子和电子缺陷散射速率

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The electron transport properties of single walled carbon nanotubes are of fundamental importance for the development of carbon based nanotechnology. Carbon nanotubes can display both chemical and structural defects, which affect electronic states near the Fermi level. This is further complicated by the fact that the concentration of defects depends upon the method of synthesis. In this work, we have investigated both electron-phonon and electron-defect scattering in semiconducting zigzag carbon nanotubes by calculating and analyzing the quantum-mechanical scattering rates for these processes. One objective of this work is to give a theoretical limit for the concentration of defects at which electron-defect scattering rates would be comparable to the electron-phonon scattering rates.
机译:单壁碳纳米管的电子传输特性对于碳基纳米技术的发展至关重要。碳纳米管可以显示化学和结构缺陷,这些缺陷会影响费米能级附近的电子态。缺陷的浓度取决于合成方法,这使情况进一步复杂化。在这项工作中,我们通过计算和分析这些过程的量子机械散射速率,研究了半导体之字形碳纳米管中的电子-声子散射和电子缺陷散射。这项工作的一个目标是对缺陷的浓度给出一个理论上的限制,在该浓度下,电子缺陷的散射速率将与电子-声子的散射速率相当。

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