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Procedure for measuring trace quantities of S_2F_10, S_2F_10, and S_2O_2F_10 in SF_6 using chromatograph-mass spectrometer

机译:使用质谱仪测定SF_6中S_2F_10,S_2F_10和S_2O_2F_10的痕量

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The compounds S_2F_10, S_2F_10, and S_2o_2F_10 are formed by decomposition of gaseous sulfur hexafluoride (SF_6) in electrical discharges.~1.2 The species S_2F_10 is known to be highly toxic to humans,~3 and there is recent evidence that S_2O_2F_10 may also be very toxic.~4 There is, therefore, an interest in having analytical methods to detect these compounds in compressed SF_6 at trace levels down to 10 parts in 10~9 by volume (10 ppb_v). Two chromatographic methods have been used to detect these compounds at the 10 ppb_v level or lower. The first method developed by Sauers and coworkers~5 is based on a cryoigenic enrichment procedure first proposed by Janssen~6, and uses a gas chromatograph with an electron-capture detector. The second method, which is the focus of the present work, utilizes a gas chromatograph-mass spectrometer (GC/MS)with a thermal-chemical converter.
机译:化合物S_2F_10,S_2F_10和S_2o_2F_10是由放电中的气态六氟化硫(SF_6)分解形成的。〜1.2物种S_2F_10对人有高毒性,〜3,并且最近有证据表明S_2O_2F_10也可能对人非常有毒。因此,有兴趣提供一种分析方法来检测压缩的SF_6中的这些化合物,其痕量水平低至10〜9体积(10 ppb_v)中的10份。已使用两种色谱法检测10 ppb_v或更低水平的这些化合物。 Sauers和其同事〜5开发的第一种方法是基于Janssen〜6首先提出的低温致富程序,并使用了带有电子捕获检测器的气相色谱仪。第二种方法是当前工作的重点,它利用了带有热化学转化器的气相色谱-质谱仪(GC / MS)。

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