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Leakage Current Property of Pb(Zr0.4, Ti0.6)O3 Thin-film Capacitors with Highly Rectangular Hysteresis Property

机译:具有高矩形磁滞特性的Pb(Zr 0.4 ,Ti 0.6 )O 3 薄膜电容器的漏电流特性

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The Pb(Zr0.4, Ti0.6)O3 thin-film capacitors with top and bottom Pt electrodes were prepared by chemical solution deposition using the precursor solutions with Pb contents ranging from 104 to 119%. Leakage current densities of the PZT capacitors monotonically decreased with increasing Pb contents. In the Pb110%-PZT capacitor, a conduction mechanism changed from the Schottky emission to the Poole-Frenkel at an electric field of approximately 80 kV/cm at RT while the leakage current was limited only by the Poole-Frenkel in case of less Pb contents. In the Pb110%-PZT capacitor, the Schottky barrier height and a relative permittivity were estimated to be 1.1 eV and 4.8, respectively, and the activation energy of trap sites in the Poole-Frenkel conduction was estimated to be 0.5 eV.
机译:通过化学溶液沉积法制备了具有顶部和底部Pt电极的Pb(Zr 0.4 ,Ti 0.6 )O 3 薄膜电容器。前体溶液中Pb含量在104%至119%之间。 PZT电容器的漏电流密度随Pb含量的增加而单调降低。在Pb110%-PZT电容器中,在室温下,在大约80 kV / cm的电场下,传导机理从肖特基发射变为Poole-Frenkel,而在Pb较少的情况下,泄漏电流仅受Poole-Frenkel的限制。内容。在Pb110%-PZT电容器中,肖特基势垒高度和相对介电常数分别估计为1.1 eV和4.8,在Poole-Frenkel传导中的陷阱位点的活化能估计为0.5 eV。

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