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Molecular dynamics simulation of plasma-surface interactions during dry etching processes

机译:干法刻蚀过程中等离子体与表面相互作用的分子动力学模拟

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Molecular dynamics (MD) simulations are used to study non-thermal-equilibrium reaction dynamics taking place on the surface during dry etching processes. In MD simulations, the motion of each atom is solved numerically based upon pre-determined interatomic potential functions and data of interest (such as sputtering yields, deposition rates, etch products, etc.) are evaluated from statistical averaging of relevant instantaneous data obtained from the simulations. In this paper, we review our recent MD simulations results on organic polymer etching. Similar simulations were also performed for selective etching processes of silicon and silicon dioxide substrates.
机译:分子动力学(MD)模拟用于研究在干法刻蚀过程中在表面上发生的非热平衡反应动力学。在MD模拟中,每个原子的运动都基于预定的原子间电势函数进行数值求解,并根据统计平均值计算感兴趣的数据(例如溅射产率,沉积速率,蚀刻产物等),然后对这些数据进行统计求值模拟。在本文中,我们回顾了有关有机聚合物蚀刻的最新MD模拟结果。还对硅和二氧化硅衬底的选择性蚀刻工艺进行了类似的模拟。

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