The design of a novel low-power and high-precision voltage testing circuit

摘要

This paper presents the design of a novel low-power and high-precision voltage testing circuit. The circuit consists of a temperature-insensitive reference voltage generator and a voltage follower to eliminate the loading effect. The circuit has been fabricated in 0.8 /spl mu/m CMOS technology and its performance has been measured, which shows that the circuit functions are consistence with the theoretical analysis and Spice simulation.