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New superfast power closing switched-dynistors on delayed ionization

机译:新型超快功率闭合开关式测振器,用于延迟电离

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The fastest from known semiconductor electrically triggered power closing switches have turn on times of dozens of nanoseconds at /spl sim/1 kV blocking voltage and /spl sim/100 A switching current. Any attempt to increase the device voltage leads to an increase of the device thickness and an increase of turn-on times. Spark gaps, although faster, have severely limited lifetimes. The effect of delayed ionization has allowed for the development of a new kind of power superfast switch-silicon avalanche shapers (SAS)-in which time of flight limitation on speed has bean overcome. This approach has been used to develop new power superfast devices-fast ionization dynistors (FID)-which behave like a thyristor in that they have two steady states: nonconducting; and high-conducting. The fast (less than 1 ns) transition from the nonconducting to high-conducting state is induced by delayed ionization by the application of a short (nanosecond) high-voltage (kilovolts) pulse to the blocking p-n junction of the multilayered n/sup +/pnp/sup +/ semiconductor structure. Due to regenerative feedback, as in usual thyristors, the structure remains in the high-conducting state infinitely. To switch on the device, it is necessary to break the current by using an external circuit.
机译:在已知的/ spl sim / 1 kV阻断电压和/ spl sim / 100A的开关电流下,已知的半导体电触发功率闭合开关中最快的导通时间为数十纳秒。任何试图增加器件电压的尝试都会导致器件厚度的增加和导通时间的增加。火花间隙虽然较快,但使用寿命受到严重限制。延迟电离的影响已允许开发一种新型的功率超快开关硅雪崩整形器(SAS),其克服了飞行时间对速度的限制。这种方法已被用于开发新的功率超快器件,即快速电离测功机(FID),其行为类似于晶闸管,因为它们具有两个稳态:非导电;和高导电性。通过将短(纳秒)高压(千伏)脉冲施加到多层n / sup +的阻塞pn结,可延迟电离,从而从非导电状态快速转变(小于1 ns) / pnp / sup + /半导体结构。与通常的晶闸管一样,由于再生反馈,该结构无限地保持在高导通状态。要打开设备,必须使用外部电路断开电流。

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