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A new metric for microelectronic package assessment: application to micro/chip scale packages

机译:微电子封装评估的新指标:应用于微/芯片级封装

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A new metric for comparing microelectronic packaging technical value is presented and applied to the new field of micro or chip scale packaging technology. A thorough, detailed technical benchmark study of chip scale packages has been performed. A key result from this study is the definition of a new technology metric for comparing electronics packaging approaches. The new metric incorporates quantitative measures of performance, manufacturability, complexity and efficiency in a simple graphic presentation of relative design value. This tool is then demonstrated through application to micropackages and their comparison with more traditional SMT and MCM technologies. The combined results of the benchmark study and the new metrics provide a clear basis for intelligent risk/benefit analysis in strategic packaging technology planning and selection. The results can be applied to both system and sub-system level designs to focus engineering effort on crucial development areas. Subsequent design of experiments can then be targeted early in the development process avoiding wasted engineering effort.
机译:提出了一种比较微电子封装技术价值的新指标,并将其应用于微尺度或芯片级封装技术的新领域。芯片级封装的彻底,详细的技术基准研究已经完成。这项研究的主要成果是定义了一种用于比较电子封装方法的新技术指标。新度量标准以相对设计值的简单图形表示形式,结合了性能,可制造性,复杂性和效率的定量度量。然后通过将其应用于微包装以及将其与更传统的SMT和MCM技术进行比较来演示该工具。基准研究和新指标的组合结果为战略包装技术规划和选择中的智能风险/收益分析提供了清晰的基础。结果可以应用于系统级和子系统级设计,以将工程工作重点放在关键的开发领域。然后,可以在开发过程的早期就针对后续的实验设计,从而避免了工程上的浪费。

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