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A novel method of measuring the thickness of hydrated ultrathin polymer film by the force curve of atomic force microscopy

机译：用原子力显微镜的力曲线测量水合超薄聚合物薄膜厚度的新方法

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《》|2002年|P.27-30|共4页
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Wu; C.C.; Chang; H.C.;
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中图分类无线电电子学、电信技术;
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专利

1. Estimating the thickness of hydrated ultrathin poly(o-phenylenediamine) film by atomic force microscopy [J] . Wu CC., Chang HC. Analytica chimica acta . 2004,第2期

机译：通过原子力显微镜估计水合超薄聚（邻苯二胺）薄膜的厚度
2. Measuring the thickness and thickness uniformity of ultra-thin AlO{sub}x films in magnetic tunneling junctions by combined RBS and conducting atomic force microscopy [J] . E. Z. Luo, S. K. Wong, A. B. Pakhomov, 電子情報通信学会技術研究報告. 磁気記録. Magnetic Recording . 2001,第400期

机译：结合RBS和原子力显微镜测量磁性隧道结中超薄AlO {sub} x薄膜的厚度和厚度均匀性
3. Measuring the thickness and thickness uniformity of ultra-thin AlO{sub}x films in magnetic tunneling junctions by combined RBS and conducting atomic force microscopy [J] . E. Z. Luo, S. K. Wong, A. B. Pakhomov, 電子情報通信学会技術研究報告. 磁気記録. Magnetic Recording . 2001,第400期

机译：通过组合RBS和导电原子力显微镜测量超薄ALO {SUB} X膜在磁隧道连接中的厚度和厚度均匀性
4. A novel method of measuring the thickness of hydrated ultrathin polymer film by the force curve of atomic force microscopy [C] . C. C. Wu, H. C. Chang Annual International IEEE-EMBS Special Topic Conference on Microtechnologies in Medicine Biology . 2002

机译：一种用原子力显微镜曲线测量水合超薄聚合物膜厚度的新方法
5. Measurement of van der Waals forces by atomic force microscopy between surfaces of silicon nitride, gold, and Langmuir-Blodgett films of polymerized 10,12-nonacosadiynoic acid. [D] . Myers, Ramona Lynn. 1999

机译：通过原子力显微镜在聚合的10,12-壬二芥子酸的氮化硅，金和Langmuir-Blodgett膜的表面之间测量范德华力。
6. Using Atomic Force Microscopy to Measure Thickness of Passive Film on Stainless Steel Immersed in Aqueous Solution [O] . Rongguang Wang, Yunhui Li, Tian Xiao, -1

机译：使用原子力显微镜测量浸在水溶液中的不锈钢上的钝化膜厚度
7. Estimating the thickness of hydrated ultrathin poly(o-phenylenediamine) film by atomic force microscopy [O] . Ching-chou Wu, Hsien-chang Chang 2003

机译：用原子力显微镜估算水合超薄聚（邻苯二胺）薄膜的厚度

A novel method of measuring the thickness of hydrated ultrathin polymer film by the force curve of atomic force microscopy

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