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Surface contamination on sputter carbon coated disks measured by using low energy photoelectron spectroscopy in an ambient atmosphere

机译：通过在环境大气中使用低能光电子光谱法测量溅射碳涂层磁盘上的表面污染

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《》|2001年|P.GA-10-GA-10|共1页
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Nishimori; K.; Tanaka; K.;
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中图分类无线电电子学、电信技术;
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专利

1. Surface contamination on sputter carbon coated disks measured by using low energy photoelectron spectroscopy in an ambient atmosphere [J] . Nishimori K., Tanaka K. IEEE Transactions on Magnetics . 1990,第5期

机译：通过在环境大气中使用低能光电子光谱法测量溅射碳涂层磁盘上的表面污染
2. Ambient contamination of poly-crystalline diamond surfaces studied by high-resolution electron energy loss spectroscopy and X-ray photoelectron spectroscopy [J] . Sh. Michaelson, A. Hoffman Diamond and Related Materials . 2008,第6期

机译：高分辨率电子能量损失谱和X射线光电子能谱研究了多晶金刚石表面的环境污染
3. CARBON CONTAMINATION AT SILVER SURFACES - SURFACE PREPARATION PROCEDURES EVALUATED BY RAMAN SPECTROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY [J] . Taylor CE, Garvey SD, Pemberton JE Analytical chemistry . 1996,第14期

机译：银表面的碳污染-拉曼光谱和X射线光电子能谱估算的表面制备程序
4. Surface contamination on sputter carbon coated disks measured by using low energy photoelectron spectroscopy in an ambient atmosphere [C] . Nishimori K., Tanaka K., Institute of Electric and Electronic Engineer International Magnetics Conference . 2001

机译：在环境大气中使用低能光电子光谱测量的溅射碳涂层磁盘的表面污染
5. Investigation of Degradation at Halide Perovskite Surfaces Using Near-Ambient Pressure X-Ray Photoelectron Spectroscopy [D] . Ke, Chun-Ren. 2020

机译：近环境压力X射线光电子谱的卤化物钙钛表面降解研究
6. Near-Ambient-Pressure X-ray Photoelectron SpectroscopyStudy of Methane-Induced Carbon Deposition on Clean and Copper-Modified PolycrystallineNickel Materials [O] . Raffael Rameshan, Lukas Mayr, Bernhard Klötzer, -1

机译：近环境压力X射线光电子能谱清洁铜改性多晶上甲烷诱导的碳沉积研究镍材料
7. Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry [O] . Peter J. Cumpson, Jose F. Portoles, Anders J. Barlow, 2013

机译：精确的氩聚类离子溅射产生：通过X射线光电子能谱和二次离子质谱法测量在实际深度分析中的溅射阈值的产量和效果

Surface contamination on sputter carbon coated disks measured by using low energy photoelectron spectroscopy in an ambient atmosphere

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