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FormFactor introduces an integrated process for wafer-level packaging, burn-in test, and module level assembly

机译:FormFactor引入了用于晶圆级封装,老化测试和模块级组装的集成过程

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In semiconductor manufacturing, front end scaling (i.e. Moore's Law) continues to hold for the forseeable future. Unfortunately, the back-end processes of package assembly, burn-in and test all require wafer singulation before any of these processes can occur. Singulation immediately forces a linearly increasing cost model, scaling with the number of die/wafer, and prevents a wafer scaling cost model. FormFactor looked at the issues preventing wafer-level back-end processing, and postulated that the highest probability of success would require an approach that integrated the previously separate disciplines of materials, package assembly, burn-in, and test. The connection element to the test and burn-in systems was identified as a primary enabler or inhibitor. In this paper, we briefly describe a wafer-level back-end flow, the chip scale package that this process defines, and the early results observed with this flow and package.
机译:在半导体制造中,在可预见的未来,前端缩放(即摩尔定律)将继续保持不变。不幸的是,封装组装,预烧和测试的后端过程都需要在将这些过程中的任何一个进行之前将晶片切单。切单立即迫使线性增加的成本模型随管芯/晶片的数量而缩放,并阻止了晶片按比例缩放的成本模型。 FormFactor研究了阻止晶圆级后端处理的问题,并假定成功的最高可能性将需要一种方法,该方法应整合先前分离的材料,包装组装,老化和测试等学科。测试和老化系统的连接元素被认为是主要的使能或抑制因素。在本文中,我们简要描述了晶圆级后端流程,此过程定义的芯片级封装以及使用该流程和封装观察到的早期结果。

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