首页> 外文会议> >An efficient method for obtaining performance bounds of semiconductor manufacturing systems
【24h】

An efficient method for obtaining performance bounds of semiconductor manufacturing systems

机译:获取半导体制造系统性能界限的有效方法

获取原文

摘要

The paper presents an efficient method that applies Markovian timed Petri nets to performance analysis of semiconductor manufacturing systems. A uniformization technique is used to establish both lower and upper bounds of the performance of interest. These bounds are computed using linear programming approaches. Different experiments have been conducted on medium-sized semiconductor manufacturing models to test the accuracy of the proposed technique. Preliminary results on the relationship of the solution and the constraints are discussed.
机译:本文提出了一种有效的方法,将马尔可夫定时Petri网应用于半导体制造系统的性能分析。使用统一技术来建立目标性能的下限和上限。这些界限是使用线性规划方法计算的。已对中型半导体制造模型进行了不同的实验,以测试所提出技术的准确性。讨论了解决方案和约束条件之间关系的初步结果。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号